C. E. Schuster

Miscellaneous nut crops

C. E. Schuster, 1939 .

An Electrical Test Structure for Improved Measurement of Feature Placement and Overlay in Integrated Circuit Fabrication Processes

Richard A. Allen, C. E. Schuster, 1993 .

Semiconductor Measurement Technology: Test Structure Implementation Document: DC Parametric Test Structures and Test Methods for Monolithic Microwave Integrated Circuits (MMICs)

C. E. Schuster, 1995 .

A directed-graph classifier of semiconductor wafer-test patterns

M. W. Cresswell, Loren W. Linholm, D. Khera, 1992 .

Review of semiconductor microelectronic test structures with applications to infrared detector materials and processes

C. E. Schuster, J. Kopanski, 1993 .

Improved estimation of the resistivity of pure copper and electrical determination of thin copper film dimensions

Harry A. Schafft, Mark G. Vangel, C. E. Schuster, 2001, Microelectron. Reliab..