S. J. Hwang

Dielectric reliability of stacked Al2O3-HfO2 MIS capacitors with cylinder type for improving DRAM data retention characteristics

S. Y. Lee, J. Y. Seo, K. J. Lee, 2005, Microelectron. Reliab..

Dynamic Indoor Localization Based on Active RFID for Healthcare Applications: A Shape Constraint Approach

Tzong-Huei Lin, Herbert H. Chang, David Hung-Tsang Yen, 2009, 2009 2nd International Conference on Biomedical Engineering and Informatics.

Reliability for Recessed Channel Structure n-MOSFET

S. Y. Lee, J. Y. Seo, K. J. Lee, 2005, Microelectron. Reliab..