J. McMacken

Development of robust interconnect model based on design of experiments and multiobjective optimization

Juin J. Liou, Qiang Zhang, J. McMacken, 2001 .

A scalable compact model for III-V heterojunction bipolar transistors

J. McMacken, D. Halchin, S. Nedeljkovic, 2008, 2008 IEEE MTT-S International Microwave Symposium Digest.

Statistical modeling of MOS devices based on parametric test data for improved IC manufacturing

Qiang Zhang, K. Stiles, P. Layman, 2001, Proceedings 2001 IEEE Hong Kong Electron Devices Meeting (Cat. No.01TH8553).

Statistical modeling of MOS devices and ICs based on end-of-line manufacturing data

K. Stiles, P. Layman, Juin J. Liou, 2000, 2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406).

Parameter extraction and optimization for new industry standard VBIC model

K. Stiles, S. Moinian, J. McMacken, 1998, ASDAM '98. Conference Proceedings. Second International Conference on Advanced Semiconductor Devices and Microsystems (Cat. No.98EX172).

HBT Modeling

J. Gering, J. McMacken, S. Nedeljkovic, 2008, IEEE Microwave Magazine.