J. Thomson

Development of robust interconnect model based on design of experiments and multiobjective optimization

Juin J. Liou, Qiang Zhang, J. McMacken, 2001 .

Statistical modeling of MOS devices based on parametric test data for improved IC manufacturing

Qiang Zhang, K. Stiles, P. Layman, 2001, Proceedings 2001 IEEE Hong Kong Electron Devices Meeting (Cat. No.01TH8553).

Statistical modeling of MOS devices and ICs based on end-of-line manufacturing data

K. Stiles, P. Layman, Juin J. Liou, 2000, 2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406).

SPICE modeling and quick estimation of MOSFET mismatch based on BSIM3 model and parametric tests

Juin J. Liou, Qingwen Zhang, J. Thomson, 2001 .

Deciphering Deep Time Machine Learning

J. Thomson, 2019 .

Cover today's East and West hands and plan your play against the HK lead.

J. Thomson, S Dealer, B. Travis, 2014 .