Chia-Fu Lee

Memory Device with a Low-Current Reference Circuit

Yu-Der Chih, Chia-Fu Lee, Hon-Jarn Lin, 2017 .

Logic Process Compatible 40NM 16MB, Embedded Perpendicular-MRAM with Hybrid-Resistance Reference, Sub-μA Sensing Resolution, and 17.5NS Read Access Time

Yu-Lin Chen, Yu-Der Chih, Jonathan Chang, 2018, 2018 IEEE Symposium on VLSI Circuits.

Logic Process Compatible 40-nm 16-Mb, Embedded Perpendicular-MRAM With Hybrid-Resistance Reference, Sub- $\mu$ A Sensing Resolution, and 17.5-nS Read Access Time

Yu-Lin Chen, Yu-Der Chih, Chia-Fu Lee, 2019, IEEE Journal of Solid-State Circuits.

Unsupervised Anomaly Detection Using Light Switches for Smart Nursing Homes

Yu-Chun Chien, Chia-Fu Lee, Chun-Ting Chou, 2016, 2016 IEEE 14th Intl Conf on Dependable, Autonomic and Secure Computing, 14th Intl Conf on Pervasive Intelligence and Computing, 2nd Intl Conf on Big Data Intelligence and Computing and Cyber Science and Technology Congress(DASC/PiCom/DataCom/CyberSciTech).

5G Radio Access Network Design with the Fog Paradigm: Confluence of Communications and Computing

Hung-Yu Wei, Ai-Chun Pang, Chia-Fu Lee, 2017, IEEE Communications Magazine.

On-Chip Voltage Down Converter to Improve SRAM Read/Write Margin and Static Power for Sub-Nano CMOS Technology

Chia-Fu Lee, Fang-shi Lai, F. Lai, 2007, IEEE Journal of Solid-State Circuits.

A 1.4Mb 40-nm embedded ReRAM macro with 0.07um2 bit cell, 2.7mA/100MHz low-power read and hybrid write verify for high endurance application

Yu-Der Chih, Chia-Fu Lee, Hon-Jarn Lin, 2017, 2017 IEEE Asian Solid-State Circuits Conference (A-SSCC).

An 89TOPS/W and 16.3TOPS/mm2 All-Digital SRAM-Based Full-Precision Compute-In Memory Macro in 22nm for Machine-Learning Edge Applications

Hidehiro Fujiwara, Tan-Li Chou, Yu-Der Chih, 2021, 2021 IEEE International Solid- State Circuits Conference (ISSCC).

22nm STT-MRAM for Reflow and Automotive Uses with High Yield, Reliability, and Magnetic Immunity and with Performance and Shielding Options

Harry Chuang, Chia-Fu Lee, Yi-Chun Shih, 2019, 2019 IEEE International Electron Devices Meeting (IEDM).