S. Ristic

The effect of static dielectric constant on the band structure in heavily doped silicon

S. Zivanovic, S. Ristic, Z. Prijic, 1995, Proceedings of International Conference on Microelectronics.

MOSFET models at the edge of 100-nm sizes

G. Angelov, S. Ristic, T. Takov, 2004, 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716).