Keneth R. Wilsher

Designed -in-diagnostics: a new optical method

Keneth R. Wilsher, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits

William K. Lo, Keneth R. Wilsher, P. LeCoupanec, 2003, Microelectron. Reliab..

Optical interferometric probing of advanced microprocessors

G. Xiao, Travis M. Eiles, William K. Lo, 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).

Backside E-Beam Probing on Nano scale devices

Rudolf Schlangen, Christian Boit, Uwe Kerst, 2007, 2007 IEEE International Test Conference.

Practical optical waveform probing of flip-chip CMOS devices

William K. Lo, Keneth R. Wilsher, 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

Practical, non-invasive optical probing for flip-chip devices

Steven Kasapi, Ted Lundquist, Keneth R. Wilsher, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).