Jerzy Ruzyllo

Influence of silicon surface carbon contamination on oxide quality and SiO2-Si systems properties

Tomasz Brozek, Romuald B. Beck, Jerzy Ruzyllo, 1992, Other Conferences.

Evolution of Silicon Cleaning Technology Over the Last Twenty Years

Takeshi Hattori, P. Besson, Jerzy Ruzyllo, 2007, ECS Transactions.