J. Gill
发表
T. Sullivan,
F. Chen,
B. Li,
2006,
2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
J. Gill,
C. Laguë,
N. Lehoux,
1997
.
J. Gill,
C. Lague,
M. Khelifi,
1999
.
G. Knoblinger,
J. Gill,
S. Biesemans,
2001,
2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184).
J. Gill,
K. Rodbell,
J. Gambino,
2007,
2007 IEEE International Interconnect Technology Conferencee.
J. Gill,
C.-C. Yang,
A. Carbone,
2004,
Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729).
J. Gill,
A. von Glasow,
S. Yankee,
2002,
2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320).
J. Gill,
E. Kaltalioglu,
O. Aubel,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
J. Gill,
D. Mocuta,
D. Greenlaw,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
J. Gill,
Baozhen Li,
T.D. Sullivan,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
J. Gill,
C.-C. Yang,
A. Carbone,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
J. Gill,
M. Shinosky,
V. Ramachandran,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
J. Gill,
G. Biery,
T. Spooner,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
J. Gill,
S. Nguyen,
K. Ida,
2005,
Proceedings of the IEEE 2005 International Interconnect Technology Conference, 2005..
J. Gill,
D. Harmon,
T. Sullivan,
1999,
1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460).
J. Gill,
T. Spooner,
S. Ponoth,
2006,
2006 International Interconnect Technology Conference.
J. Gill,
Baozhen Li,
M. Angyal,
2006,
IEEE Transactions on Device and Materials Reliability.
J. Gill,
C.-C. Yang,
A. Cowley,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
J. Gill,
M. Shinosky,
T. Ema,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..