Pascal Vabre

Super-resolution 3D optical imaging of semiconductors using coherence microscopy

Driss Benhaddou, Paul C. Montgomery, Jean-Marc Lussert, 1995, Electronic Imaging.

Three-dimensional full-field dynamical characterization of micromechanical devices by stroboscopic white light scanning interferometry

Sylvain Petitgrand, Alain Bosseboeuf, Reda Yahiaoui, 2001, Lasers in Metrology and Art Conservation.

Phase stepping digital interference microscopy (PSM) image improvements by fuzzy logic algorithms

Paul C. Montgomery, Jean-Pierre Fillard, Patrick Faurous, 1995, Electronic Imaging.

3D Full field dynamical characterization of micromechanical devices by stroboscopic white light scanning interferometry

Sylvain Petitgrand, Alain Bosseboeuf, Reda Yahiaoui, 2001 .

Characterization of III-V materials by optical interferometry

Paul C. Montgomery, D. Montaner, Jean-Pierre Fillard, 1993 .