Israel Tirkel

发表

Identification of Statistical Distributions for Cycle Time in Wafer Fabrication

Yisrael Parmet, Israel Tirkel, Y. Parmet, 2017, IEEE Transactions on Semiconductor Manufacturing.

Modeling cost benefit analysis of inspection in a production line

Israel Tirkel, Gad Rabinowitz, G. Rabinowitz, 2014 .

Forecasting flow time in semiconductor manufacturing using knowledge discovery in databases

Israel Tirkel, I. Tirkel, 2013 .

Quality Performance Modeling in a Deteriorating Production System with Partially Available Inspection

Israel Tirkel, Gad Rabinowitz, 2010, OR.

Scheduling preventive maintenance within a queue time for maximum throughput in semiconductor manufacturing

Israel Tirkel, Adar A. Kalir, 2016, 2016 Winter Simulation Conference (WSC).

Approximating class-departure variability in tandem queues with downtime events: Regression-based variability function

Israel Tirkel, Gad Rabinowitz, Ruth Sagron, 2017, Comput. Oper. Res..

The effectiveness of variability reduction in decreasing wafer fabrication cycle time

Israel Tirkel, 2013, 2013 Winter Simulations Conference (WSC).

The relationship between yield and flow time in a production system under inspection

Israel Tirkel, Gad Rabinowitz, 2012 .

Yield Learning Curve Models in Semiconductor Manufacturing

Israel Tirkel, 2013, IEEE Transactions on Semiconductor Manufacturing.

New LST of inter-departure times in PH/G/1 queue, and extensions to ME/G/1 and G/G/1 queues

Israel Tirkel, Gad Rabinowitz, Yoav Kerner, 2019, Comput. Ind. Eng..

Throughput and flow-time in a production line with partial machine availability and imperfect quality processing

Israel Tirkel, Maayan Eyal, 2015, 2015 Winter Simulation Conference (WSC).

The efficiency of inspection based on out of control detection in wafer fabrication

Israel Tirkel, 2016, Comput. Ind. Eng..

Cycle time prediction in wafer fabrication line by applying data mining methods

Israel Tirkel, I. Tirkel, 2011, 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.

In-line inspection impact on Cycle Time and Yield

Israel Tirkel, Gad Rabinowitz, Noam Reshef, 2009, 2009 IEEE/SEMI Advanced Semiconductor Manufacturing Conference.

Optimized inspection capacity for out of control detection in semiconductor manufacturing

Israel Tirkel, 2012, Proceedings Title: Proceedings of the 2012 Winter Simulation Conference (WSC).

Wafer fabrication yield learning and cost analysis based on in-line inspection

David Price, Israel Tirkel, Gad Rabinowitz, 2016 .

A queuing network model for wafer fabrication using decomposition without aggregation

Israel Tirkel, Gad Rabinowitz, Dean Grosbard, 2013, 2013 IEEE International Conference on Automation Science and Engineering (CASE).

Approximation of single-class queueing networks with downtime-induced traffic variability

Israel Tirkel, Gad Rabinowitz, Dean Grosbard, 2015 .