Kruth Jean-Pierre

A test object for calibration and accuracy assessment in X-ray CT metrology

Jean-Pierre Kruth, Tan Ye, André Voet, 2010 .

Material Dependent Thresholding for Dimensional X-ray Computed Tomography

Ye Tan, Dewulf Wim, Voet André, 2011 .

Parameter dependent thresholding for dimensional X-ray computed tomography

Kim Kiekens, Dewulf Wim, Voet André, 2011 .