Sven Tougaard

发表

An application for near‐real‐time analysis of XPS data

Jereme Haack, Donald R. Baer, Alan S. Lea, 2010 .

Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy

Neal Fairley, Jonas Baltrusaitis, Sven Tougaard, 2021 .

Penetration of fluorine into the silicon lattice during exposure to F atoms, F2, and XeF2: Implications for spontaneous etching reactions

David B. Graves, D. Humbird, Sven Tougaard, 2007 .

Evaluation of theoretical models for elastic electron backscattering from surfaces

Alain Dubus, Sven Tougaard, Alexander Jablonski, 2000 .

Determination of the Cu 2p primary excitation spectra for Cu, Cu2O and CuO

Nicolas Pauly, Sven Tougaard, Francisco Yubero, 2014 .

Algorithm for automatic x-ray photoelectron spectroscopy data processing and x-ray photoelectron spectroscopy imaging

Sven Tougaard, S. Tougaard, 2005 .

Accuracy of the non‐destructive surface nanostructure quantification technique based on analysis of the XPS or AES peak shape

Sven Tougaard, S. Tougaard, 1998 .

XPS for Quantitative Analysis of Surface Nano-structures

Sven Tougaard, S. Tougaard, 2005, Microscopy and Microanalysis.

Quantitative analysis of the inelastic background in surface electron spectroscopy

Sven Tougaard, S. Tougaard, 1988 .

Scandium and lutetium surfaces studied by reflection electron energy-loss spectroscopy

Sven Tougaard, S. Tougaard, J. Onsgaard, 1980 .

Three-Dimensional X-Ray Photoelectron Tomography on the Nanoscale: Limits of Data Processing by Principal Component Analysis

Sven Tougaard, John Walton, S. Hajati, 2013, Microscopy and Microanalysis.