Ido Dolev

Characterization of EUV resists for defectivity at 32nm

Eric Hendrickx, Doron Meshulach, Shimon Levi, 2011, Advanced Lithography.

EUV defect characterization study on post litho and etch for 1x and 2x node processes

Chris Ngai, Ofir Montal, Ido Dolev, 2011, Advanced Lithography.

Functional nonlinear photonic crystals

Ido Dolev, Tal Ellenbogen, Ayelet Ganany Padowicz, 2011, International School on Quantum Electronics: Laser Physics and Applications.

Process variation monitoring (PVM) by wafer inspection tool as a complementary method to CD-SEM for mapping LER and defect density on production wafers

Doron Meshulach, Shimon Levi, Kobi Kan, 2009, Advanced Lithography.

Advanced lithography: wafer defect scattering analysis at DUV

Makoto Kaneko, Doron Meshulach, Ido Dolev, 2010, Advanced Lithography.

Simulating semiconductor structures for next-generation optical inspection technologies

Ido Dolev, James Pond, Ori Golani, 2016 .

Experimental observation of self-accelerating beams in quadratic nonlinear media.

Ido Dolev, Ady Arie, Mordechai Segev, 2012, Physical review letters.

Three wave mixing of airy beams in a quadratic nonlinear photonic crystals

Ido Dolev, Ady Arie, A. Arie, 2010 .

Surface-plasmon holographic beam shaping.

Ido Dolev, Ady Arie, Itai Epstein, 2012, Physical review letters.