Robert Tu

Berkeley reliability tools-BERT

Elyse Rosenbaum, Ping-Keung Ko, Chenming Hu, 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

A new approach for simulation of circuit degradation due to hot-electron damage in NMOSFETs

Elyse Rosenbaum, Chenming Hu, K. N. Quader, 1991, International Electron Devices Meeting 1991 [Technical Digest].

Simulating radiation reliability with BERT

Paolo Pavan, Ping Keung Ko, Chenming Hu, 1995 .

A bidirectional NMOSFET current reduction model for simulation of hot-carrier-induced circuit degradation

Elyse Rosenbaum, Ping Keung Ko, Chenming Hu, 1993 .

Simulating total-dose radiation effects on circuit behavior

Paolo Pavan, Chenming Hu, Ping Keung Ko, 1994, Proceedings of 1994 IEEE International Reliability Physics Symposium.

A complete radiation reliability software simulator

Paolo Pavan, Chenming Hu, E. R. Minami, 1994 .

Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection

Jung-Suk Goo, Germain Bossu, Robert Tu, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).