M. Redford

Test structures and analysis techniques for estimation of the impact of layout on MOSFET performance and variability

S. Saxena, S. Minehane, J. Cheng, 2004, Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).

Application of covariance based models to fit response surfaces to experimental data

Anthony J. Walton, M. Redford, D. Sprevak, 1999, 1999 4th International Workshop on Statistical Metrology (Cat. No.99TH8391).

Accurate prediction of deep submicron CMOS device characteristics using inverse modeling techniques

M. Redford, S. K. Pandey, Qian Wensheng, 2001, 2001 6th International Workshop on Statistical Methodology (Cat. No.01TH8550).

On-wafer RF Figure-of-Merit Circuit Block Design for Technology Development, Process Control and PDK Validation

S. Minehane, M. Sengupta, M. Quarantelli, 2007, 2007 IEEE International Conference on Microelectronic Test Structures.

A technology development SRAM approach with DFM considerations

S.S. Mahant-Shetti, M. Redford, R. Taylor, 2000, 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072).

The Teaching Company scheme, an academic-industry partnership-a case study

M. Redford, E. Price, 1993, [1993] Proceedings of the Tenth Biennial University/Government/Industry Microelectronics Symposium.

Analysis of mixed-signal manufacturability with statistical technology CAD (TCAD)

M. Redford, J. K. Kibarian, D. A. Hanson, 1996 .

Addressable test structures for MOSFET variability analysis

M. Redford, D. Vigar, R. Herberholz, 2012, 2012 IEEE International Conference on Microelectronic Test Structures.

Analysis of mixed-signal manufacturability with statistical TCAD

M. Redford, J. K. Kibarian, D. A. Hanson, 1995, Proceedings of International Symposium on Semiconductor Manufacturing.

An Academic-Industry Partnership: A Case Study of a Teaching Company

M. Redford, T. E. Price, 1994 .