Vincent Huang

Improving focus performance at litho using diffraction-based focus metrology, novel calibration methods, interface, and control loop

Frank Staals, Jiarui Hu, Kaustuve Bhattacharyya, 2016, SPIE Advanced Lithography.

A robust benchmark for germline structural variant detection

Sergey Koren, Adam M. Phillippy, Iman Hajirasouliha, 2019, bioRxiv.

SRAF Optimization for sub-40nm Technology Node Contact Patterning

Qingwei Liu, Yu Zhu, Recco Zhang, 2012 .