A. S. Tararaksin

Automated test system for parametric control of voltage supervisors

L. N. Kessarinskiy, A. Y. Nikiforov, N. E. Aristova, 2015, 2015 International Siberian Conference on Control and Communications (SIBCON).

Automatic test complex for parametric control of power NMOS and PMOS transistors

L. N. Kessarinskiy, N. E. Aristova, A. S. Tararaksin, 2015, 2015 International Siberian Conference on Control and Communications (SIBCON).

Single-event-effect sensetivity characterization of LSI circuits with a laser-based and a pulsed gamma-ray testing facilities used in combination

A. S. Tararaksin, A. V. Yanenko, A. I. Chumakov, 2012 .