Masayasu Fukunaga

On effective criterion of path selection for delay testing

Seiji Kajihara, Sadami Takeoka, Masayasu Fukunaga, 2003, ASP-DAC '03.

Estimation of delay test quality and its application to test generation

Xiaoqing Wen, Kazumi Hatayama, Seiji Kajihara, 2007, ICCAD.

On Statistical Estimation of Fault Efficiency for Path Delay Faults Based on Untestable Path Analysis

Seiji Kajihara, Sadami Takeoka, Masayasu Fukunaga, 2005, IEICE Trans. Inf. Syst..

Path delay test compaction with process variation tolerance

Xiaoqing Wen, Toshiyuki Maeda, Seiji Kajihara, 2005, Proceedings. 42nd Design Automation Conference, 2005..

On estimation of fault efficiency for path delay faults

Seiji Kajihara, Sadami Takeoka, Masayasu Fukunaga, 2003, 2003 Test Symposium.

A dynamic test compaction procedure for high-quality path delay testing

Xiaoqing Wen, Toshiyuki Maeda, Seiji Kajihara, 2006, Asia and South Pacific Conference on Design Automation, 2006..