R.L. Rennie

Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter

V. Ramachandran, K. Kruckmeyer, R.L. Rennie, 2008, IEEE Transactions on Nuclear Science.

Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method

V. Ramachandran, K. Kruckmeyer, T. Hossain, 2007, 2007 IEEE Radiation Effects Data Workshop.