Se-Jang Oh

Via-Stubs forSignal Integri'ty Improvement intheSemiconductor Test Board

Sang-Hoon Lee, Sung-Ho Joo, Dong-Yeop Kim, 2007 .

Signal Integrity Improvements of a MEMS Probe Card Using Back-Drilling and Equalizing Techniques

Sang-Hoon Lee, Hai-Young Lee, Jindo Byun, 2011, IEEE Transactions on Instrumentation and Measurement.

A Serial Optical Link Based Memory Test System for High-Speed and Multi-Parallel Test

Sang-Hoon Lee, Ki-Jae Song, Soohaeng Cho, 2010, Journal of Lightwave Technology.

Resistively-Terminated Via-Stubs for Signal Integrity Improvement in the Semiconductor Test Board

Sung-Ho Joo, Se-Jang Oh, Ki-Sang Kang, 2007, 2007 Korea-Japan Microwave Conference.