Hideharu Nagasawa

Method for the production of silver and apparatus for implementing this method

Yasunori Minami-Ashigara-shi Ichikawa, Hideharu Nagasawa, Tetsuo Nomiyama, 2000 .

A new method for measuring the coupling coefficient of a split-gate flash EEPROM without an additional test structure

K. Mameno, Hideharu Nagasawa, Hideaki Fujiwara, 2001, ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153).

The influence of SiN films on negative bias temperature instability and characteristics in MOSFET's

Y. Matsushita, K. Yodoshi, Atsuhiro Nishida, 1998, ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).

Elimination of Negative Charge-Up during High Current Ion Implantation (Special Issue on Quarter Micron Si Device and Process Technologies)

Koji Suzuki, Atsuhiro Nishida, Kiyoshi Yoneda, 1994 .

Design of a New Micromixer for Instant Mixing Based on the Collision of Micro Segments

Hideharu Nagasawa, Kazuhiro Mae, Nobuaki Aoki, 2005 .