E. Sicard

CESAME: a test chip for the validation of a parasitic emission prediction flow in 0.18 /spl mu/m CMOS technology

S. Bendhia, B. Vrigno, L. Courau, 2004, 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559).

Characterisation of micro-controller electromagnetic emission: models for an international standard

S. Ben Dhia, S. Baffreau, E. Sicard, 2002, Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611).

Measurement techniques for coupling characterisation inside CMOS integrated circuits

E. Sicard, J.-Y. Fourniols, C. Garres, 1994, Proceedings of IEEE Symposium on Electromagnetic Compatibility.

Modeling of the substrate coupling path for direct power injection in integrated circuits

R. Perdriau, M. Ramdani, M. Drissi, 2008, 2008 IEEE International Symposium on Electromagnetic Compatibility.

A Case Study to Apprehend RF Susceptibility of Operational Amplifiers

E. Sicard, A. Boyer, 2019, 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo).

Cross-talk extraction from mask layout

J. L. Noullet, E. Sicard, A. Rubio, 1993, 1993 European Conference on Design Automation with the European Event in ASIC Design.