The bayesian reliability growth model of exponential product based on dynamic distribution parameters

Regarding to the problems of traditional reliability growth models, for example, Duane model, which have been used in the multiple stages reliability assessment. This paper firstly studied on the statistical analysis method of different stages and different level data based on sequence binding model, then modeled the change event of dynamic distribution parameters during test and gave the Bayesian reliability growth model of multiple stages exponential distribution product. Finally the method has been validated by a practice example.