论文信息 - Multiport Measurement Method Using a Two-Port Network Analyzer With Remaining Ports Unterminated

Multiport Measurement Method Using a Two-Port Network Analyzer With Remaining Ports Unterminated

A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure.

Joungho Kim | Dong Gun Kam

[1] W. Eisenstadt,et al. Combined differential and common-mode scattering parameters: theory and simulation , 1995 .

[2] J.A. Reynoso-Hernandez,et al. Analytical model and parameter extraction to account for the pad parasitics in RF-CMOS , 2005, IEEE Transactions on Electron Devices.

[3] R. Speciale,et al. A Rigorous Technique for Measuring the Scattering Matrix of a Multiport Device with a 2-Port Network Analyzer , 1982 .

[4] Jongbae Park,et al. Accurate measurement of power/ground impedance with embedded film capacitor using two-port self-impedance measurement technique , 2003, Proceedings of the 5th Electronics Packaging Technology Conference (EPTC 2003).

[5] I. Rolfes,et al. Multiport method for the measurement of the scattering parameters of N-ports , 2005, IEEE Transactions on Microwave Theory and Techniques.