Technological innovations for a sustainable business model in the semiconductor industry
暂无分享,去创建一个
[1] David J. Elliott,et al. Analysis of photoresist edge bead removal using laser light and gas , 2010, Advanced Lithography.
[2] Warren Montgomery,et al. 22nm half-pitch patterning by CVD spacer self alignment double patterning (SADP) , 2008, SPIE Advanced Lithography.
[3] Harry J. Levinson,et al. Overview of Lithography: Challenges and Metrologies , 2003 .
[4] Igor Jekauc,et al. Necessity of chemical edge bead removal in modern-day lithographic processing , 2004, SPIE Advanced Lithography.
[5] E. Spiller,et al. Controlled fabrication of multilayer soft‐x‐ray mirrors , 1980 .
[6] Harry J. Levinson,et al. Self-aligned double patterning (SADP) compliant design flow , 2012, Advanced Lithography.
[7] Zhirong Huang,et al. A review of x-ray free-electron laser theory. , 2007 .
[8] Yunfei Deng,et al. Decomposition strategies for self-aligned double patterning , 2010, Advanced Lithography.
[9] Yunfei Deng,et al. Double patterning compliant logic design , 2011, Advanced Lithography.
[10] Vincent Wiaux,et al. Split and design guidelines for double patterning , 2008, SPIE Advanced Lithography.
[11] M. Yurkov,et al. The Physics of Free Electron Lasers , 1999 .
[12] Oleg A. Shevchenko,et al. Compact 13.5-nm free-electron laser for extreme ultraviolet lithography , 2011 .