Memory deviece test device and memory system test device

A memory system testing apparatus according to the present invention, for testing, the possible number of memory modules, the first memory system, the binder can first test board and also the second memory system with the other of the plurality of memory modules composed of a binder the second test board unit comprising a test board, the first test board in a first for providing a first power source for the test of the memory system power supply and the second test board in for the test of the second memory system claim 2 is characterized in that a second power supply including a power supply and a power supply control unit for controlling at least one of a service point and the service time of the second power of the first power source providing power.