Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
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Alexander M. Korsunsky | Fabio Carassiti | Marco Sebastiani | Edoardo Bemporad | W. D. Nix | W. Nix | A. Korsunsky | C. Eberl | M. Sebastiani | F. Carassiti | E. Bemporad | Christoph Eberl
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