Simulation Analysis of Electromagnetic Shielding of Electronic Device Chassis

In recent years, with the rapid development of microelectronics technology, various military electronic systems have adopted a large number of ultra-large-scale integrated circuits. Electromagnetic pulses can easily enter the device through slots on the device chassis, which would affect the normal operation of internal electronic components. Therefore, it is necessary to predict the electromagnetic environment inside the chassis when EMP propagates into the slots to guide the chassis design. This paper firstly uses the electromagnetic pulse test results of a certain chassis to verify the simulation results, and then uses this simulation method to study the coupling law of electromagnetic pulses to one electronic device chassis. The electromagnetic structure simulation model is established, and the coupling law of the typical electromagnetic pulse to the chassis is studied through simulation. The simulation analysis results are of great significance for the shielding optimization design and electromagnetic compatibility prediction of electronic equipment.