Bounds on population coverage using test generation by fault sampling

Abstract In ‘test generation by fault sampling’, a new method of test generation was proposed by restricting the testing process to a sample of faults. The population coverage of tests generated on the sample, as well as the sample size, are estimated and are dependent on the testability profile of the circuit. In this paper we provide the necessary framework to validate the method statistically. Bounds on the estimated population coverage (in relation to actual coverage) are given without the need to apply full fault simulation. Experimental results on the large ISCAS benchmark circuits reflect the accuracy of this work.

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