Cross‐correlation‐based trans‐impedance amplifier for current noise measurements

This work proposes a cross‐correlation‐based trans‐impedance amplifier for current noise measurements in the low‐frequency range. The proposed solution is compared with the classical cross‐correlation trans‐impedance amplifier showing a lower background noise. Furthermore, a three‐step measurement method, based on the new trans‐impedance amplifier, is proposed to cancel the residual background noise. SPICE simulations and noise measurements performed on prototype circuits demonstrate the validity of the proposed approach. Copyright © 2008 John Wiley & Sons, Ltd.

[1]  H. Rothe,et al.  The theory of noisy four-poles , 1954, Transactions of the IRE Professional Group on Electron Devices.

[2]  A. van der Ziel,et al.  Representation of noise in linear two-ports , 1969 .

[3]  A. Ziel Noise; sources, characterization, measurement , 1970 .

[4]  J. A. Connelly,et al.  Low noise electronic system design , 1993 .

[5]  Jiansheng Xu,et al.  The study of the relation between Rn - Gn noise model and En - In noise model of an amplifier , 1998 .

[6]  Giorgio Ferrari,et al.  Spectrum analyzer with noise reduction by cross-correlation technique on two channels , 1999 .

[7]  Giorgio Ferrari,et al.  High sensitivity noise measurement with a correlation spectrum analyzer , 2000, IEEE Trans. Instrum. Meas..

[8]  Derek Abbott,et al.  A complete operational amplifier noise model: analysis and measurement of correlation coefficient , 2000 .

[9]  Felice Crupi,et al.  A new method for high-sensitivity noise measurements , 2002, IEEE Trans. Instrum. Meas..

[10]  Giuseppe Iannaccone,et al.  Theory and experiment of suppressed shot noise in 'stress-induced leakage currents , 2003 .

[11]  G. Giusi,et al.  A novel ultra sensitive method for voltage noise measurements , 2005, 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings.

[12]  D. Misra,et al.  Impact of high-k gate stack material with metal gates on LF noise in n- and p-MOSFETs , 2005 .

[13]  C. Ciofi,et al.  Comparative study of drain and gate low-frequency noise in nMOSFETs with hafnium-based gate dielectrics , 2006, IEEE Transactions on Electron Devices.

[14]  Felice Crupi,et al.  Enhanced sensitivity cross-correlation method for voltage noise measurements , 2006, IEEE Transactions on Instrumentation and Measurement.

[15]  Felice Crupi,et al.  Ultrasensitive method for current noise measurements , 2006 .

[16]  G. Giusi,et al.  Instrumentation Design for Gate and Drain Low Frequency Noise Measurements , 2006, 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings.

[17]  G. Giusi,et al.  Two-channel amplifier for high-sensitivity voltage noise measurements , 2007, 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007.

[18]  Felice Crupi,et al.  Two-channel amplifier for high-sensitivity voltage noise measurements , 2006, 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007.

[19]  Stilianos Siskos,et al.  Analysis and selection criteria of BSIM4 flicker noise simulation models , 2008, Int. J. Circuit Theory Appl..