Dealing with Correlation and Sparsity for an Effective Exploitation of the Compressive Processing in Electromagnetic Inverse Problems

In this paper, a novel method for tomographic microwave imaging based on the Compressive Processing (CP) paradigm is proposed. The retrieval of the dielectric profiles of the scatterers is carried out by efficiently solving both the sampling and the sensing problems suitably formulated under the first order Born approximation. Selected numerical results are presented in order to show the improvements provided by the CP with respect to conventional compressive sensing (CSE) approaches.

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