论文信息 - The combined use of He back-scattering and He-induced X-rays in the study of anodically grown oxide films on GaAs☆ - 字舞流文

The combined use of He back-scattering and He-induced X-rays in the study of anodically grown oxide films on GaAs☆

L. Feldman | J. Poate | B. Schwartz | F. Ermanis

[1] J. Poate,et al. Anodic Oxide Films on GaP , 1973 .

[2] J. Poate,et al. A Rutherford scattering study of the chemical composition of native oxides on GaP , 1973 .

[3] J. D. Garcia. X-Ray Production by Alpha-Particle Impact , 1971 .