SiC power device reliability
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Gangyao Wang | Sei-Hyung Ryu | John W. Palmour | Daniel J. Lichtenwalner | Brett Hull | Donald A. Gajewski | Scott T. Allen | S. Ryu | B. Hull | J. Palmour | S. Allen | D. Lichtenwalner | Gangyao Wang | D. Gajewski | Eric Bonelli | Habib Mustain | H. Mustain | E. Bonelli
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