γ-irradiation hardness of short-channel nMOSFETs fabricated in a SOI technology
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Eddy Simoen | V. G. Litovchenko | A. A. Evtukh | A. A. Efremov | E. Simoen | C. Claeys | V. Litovchenko | Corneel Claeys | A. Efremov | A. Kizjak | J Rassamakin | A. Evtukh | A. Kizjak | J. Rassamakin
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