Adhesion as an interplay between particle size and surface roughness.

Surface roughness plays an important role in the adhesion of small particles. In this paper we have investigated adhesion as a geometrical effect taking into account both the particle size and the size of the surface features. Adhesion is studied using blunt model particles on surfaces up to 10 nm root-mean-square (RMS) roughness. Measurements with particles both smaller and larger than surface features are presented. Results indicate different behavior in these areas. Adhesion of particles smaller than or similar in size to the asperities depend mainly on the size and shape of the asperities and only weakly on the size of the particle. For large particles also the particle size has a significant effect on the adhesion. A new model, which takes the relative size of particles and asperities into account, is also derived and compared to the experimental data. The proposed model predicts adhesion well over a wide range of particle/asperity length scales.

[1]  J. Drelich,et al.  A distribution of AFM pull-off forces for glass microspheres on a symmetrically structured rough surface , 2005 .

[2]  Kevin Cooper,et al.  Simulation of the Adhesion of Particles to Surfaces. , 2001, Journal of colloid and interface science.

[3]  G. G. Stokes.  "J." , 1890, The New Yale Book of Quotations.

[4]  J. Sader,et al.  Calibration of rectangular atomic force microscope cantilevers , 1999 .

[5]  Ali Ata,et al.  Adhesion between nanoscale rough surfaces. II. Measurement and comparison with theory , 2000 .

[6]  Mikko Ritala,et al.  Atomic Layer Deposition of Photocatalytic TiO2 Thin Films from Titanium Tetramethoxide and Water , 2004 .

[7]  Singh,et al.  Adhesion between Nanoscale Rough Surfaces. , 2000, Journal of colloid and interface science.

[8]  J. Drelich,et al.  Pull-off force measurements between rough surfaces by atomic force microscopy. , 2002, Journal of colloid and interface science.

[9]  Gupta,et al.  Analysis of Contact Interactions between a Rough Deformable Colloid and a Smooth Substrate. , 2000, Journal of colloid and interface science.

[10]  Mikko Ritala,et al.  Atomic layer deposition (ALD): from precursors to thin film structures , 2002 .

[11]  H. Butt,et al.  Force measurements with the atomic force microscope: Technique, interpretation and applications , 2005 .

[12]  Y Samitsu.  A study of silicon-wafer surface evaluation using atomic force microscopy , 1993 .

[13]  R. M. Cannon,et al.  Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengths , 1995 .

[14]  S. Garofalini,et al.  Modeling of hydrophilic wafer bonding by molecular dynamics simulations , 2001 .

[15]  Anne Gelb,et al.  Roughness models for particle adhesion. , 2004, Journal of colloid and interface science.

[16]  S. S. Panesar,et al.  The effect of surface topography on the adhesion of poly(urethane)-metal contacts , 1992 .

[17]  D. Tabor.  Surface Forces and Surface Interactions , 1977 .