A cost-driven reliability demonstration plan based on accelerated degradation tests

Abstract Reliability demonstration tests (RDTs) have been widely adopted to verify reliability requirements of manufacturing products. In practice, due to the limited resource and tight development schedule for new products, it is preferable to determine the decision variables including the termination time and the sample size for the RDT in advance. Existing degradation models often fail to capture the nonlinear degradation characteristics of testing items with complicated degradation mechanisms. This paper proposes a reliability demonstration method using an accelerated degradation test (ADT) in the context of a nonlinear random-coefficients model. First, we present the capabilities of the proposed ADT model to degradation data. Then, the cost-effective RDT plan is derived based on two types of decision risks and reliability requirements from both producers and customers, while meeting certain testing time constraints. The proposed method is illustrated using two practical examples. Finally, sensitivity analysis is provided to evaluate the robustness of the proposed RDT plan using ADT data.

[1]  Rong Li,et al.  Residual-life distributions from component degradation signals: A Bayesian approach , 2005 .

[2]  Min Xie,et al.  Stochastic modelling and analysis of degradation for highly reliable products , 2015 .

[3]  France Mentré,et al.  Design in nonlinear mixed effects models: Optimization using the Fedorov–Wynn algorithm and power of the Wald test for binary covariates , 2007, Statistics in medicine.

[4]  E. Vonesh,et al.  Linear and Nonlinear Models for the Analysis of Repeated Measurements , 1996 .

[5]  L. Sheiner,et al.  Modelling of individual pharmacokinetics for computer-aided drug dosage. , 1972, Computers and biomedical research, an international journal.

[6]  Guang Jin,et al.  Reliability Demonstration for Long-Life Products Based on Degradation Testing and a Wiener Process Model , 2014, IEEE Transactions on Reliability.

[7]  John A. Nelder,et al.  A Simplex Method for Function Minimization , 1965, Comput. J..

[8]  W. Meeker Accelerated Testing: Statistical Models, Test Plans, and Data Analyses , 1991 .

[9]  Xiang Lu,et al.  Reliability demonstration methodology for products with Gamma Process by optimal accelerated degradation testing , 2015, Reliab. Eng. Syst. Saf..

[10]  Suk Joo Bae,et al.  Cost-effective degradation test plan for a nonlinear random-coefficients model , 2013, Reliab. Eng. Syst. Saf..

[11]  Wei Luo,et al.  Reliability demonstration based on accelerated degradation testing for unknown model parameters , 2013 .

[12]  Veeresh Gadag,et al.  Progressively Censored Reliability Sampling Plans for the Weibull Distribution , 2000, Technometrics.

[13]  D. Bates,et al.  Approximations to the Log-Likelihood Function in the Nonlinear Mixed-Effects Model , 1995 .

[14]  W. Nelson Statistical Methods for Reliability Data , 1998 .

[15]  Guangbin Yang,et al.  Heuristic Degradation Test Plans for Reliability Demonstration , 2013, IEEE Transactions on Reliability.

[16]  Guangbin Yang Reliability Demonstration Through Degradation Bogey Testing , 2009, IEEE Transactions on Reliability.

[17]  Donghua Zhou,et al.  Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process , 2012, IEEE Transactions on Reliability.

[18]  Fu-Kwun Wang,et al.  Useful lifetime analysis for high-power white LEDs , 2014, Microelectron. Reliab..

[19]  Bong-Jin Yum,et al.  Comparisons of Exponential Life Test Plans with Intermittent Inspections , 2000 .

[20]  B. Yum,et al.  Optimal design of accelerated degradation tests based on Wiener process models , 2011 .

[21]  W. B. Nelson,et al.  A bibliography of accelerated test plans part II - references , 2005, IEEE Transactions on Reliability.

[22]  Elsayed A. Elsayed,et al.  Overview of Reliability Testing , 2012, IEEE Transactions on Reliability.

[23]  Luis A. Escobar,et al.  Accelerated degradation tests: modeling and analysis , 1998 .

[24]  Om Prakash Yadav,et al.  A literature review on planning and analysis of accelerated testing for reliability assessment , 2017, Qual. Reliab. Eng. Int..

[25]  Qingqing Zhai,et al.  A random-effects Wiener degradation model based on accelerated failure time , 2018, Reliab. Eng. Syst. Saf..

[26]  Xiaopeng Jiang,et al.  A Review of Prognostic Techniques for High-Power White LEDs , 2017, IEEE Transactions on Power Electronics.

[27]  Marc Lavielle,et al.  Maximum likelihood estimation in nonlinear mixed effects models , 2005, Comput. Stat. Data Anal..

[28]  Chanseok Park,et al.  Stochastic degradation models with several accelerating variables , 2006, IEEE Transactions on Reliability.

[29]  Koji Hisada,et al.  Reliability tests for Weibull distribution with varying shape-parameter, based on complete data , 2002, IEEE Trans. Reliab..

[30]  Tao Yuan,et al.  A Bayesian approach to modeling two-phase degradation using change-point regression , 2015, Reliab. Eng. Syst. Saf..

[31]  P. V. Varde,et al.  Light emitting diodes reliability review , 2012, Microelectron. Reliab..

[32]  William Q. Meeker,et al.  A Review of Accelerated Test Models , 2006, 0708.0369.

[33]  H. F. Martz,et al.  A Bayesian Zero-Failure (BAZE) Reliability Demonstration Testing Procedure , 1979 .

[34]  Wei Luo,et al.  Accelerated reliability demonstration under competing failure modes , 2015, Reliab. Eng. Syst. Saf..

[35]  W. B. Nelson,et al.  A bibliography of accelerated test plans , 2005, IEEE Transactions on Reliability.

[36]  Haitao Liao,et al.  A review on degradation modelling and its engineering applications , 2017 .

[37]  Julien Baussaron,et al.  Degradation test plan for Wiener degradation processes , 2011, 2011 Proceedings - Annual Reliability and Maintainability Symposium.

[38]  Zhengqiang Pan,et al.  A zero-failure reliability demonstration approach based on degradation data , 2012, 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering.

[39]  D. Bates,et al.  Nonlinear mixed effects models for repeated measures data. , 1990, Biometrics.

[40]  Bo Guo,et al.  Residual life estimation based on a generalized Wiener degradation process , 2014, Reliab. Eng. Syst. Saf..

[41]  Joong Soon Jang,et al.  Acceptance sampling based on reliability degradation data , 2001, Reliab. Eng. Syst. Saf..

[42]  Yu Zhao,et al.  Reliability Demonstration for Long-Life Products Based on Hardened Testing Method and Gamma Process , 2017, IEEE Access.