Positioning Pd catalyst particles for carbon nanotube growth using charge patterns created with a scanning electron microscope

Positioning of charged nanoparticles with the help of charge patterns in an insulator substrate is a known method. However, the creation of charge patterns with a scanning electron microscope for this is relatively new. Here a scanning electron microscope is used for the creation of localized charge patterns in an insulator, while a glowing wire generator is used as the nanoparticle source. The deposited palladium nanoparticles are used as catalysts for the localized growth of carbon nanotubes in a chemical vapor deposition oven. The authors show first the results on local carbon nanotube growth using this procedure.

[1]  C. W. Hagen,et al.  Directed assembly of nano-particles with the help of charge patterns created with scanning electron microscope , 2009 .

[2]  Tomokazu Ishikawa,et al.  Role of Negative Electric Field Biasing on Growth of Vertically Aligned Carbon Nanotubes Using Chemical Vapor Deposition , 2008, Japanese Journal of Applied Physics.

[3]  Yiyu Feng,et al.  Horizontally aligned single-walled carbon nanotube on quartz from a large variety of metal catalysts. , 2008, Nano letters.

[4]  A. Schmidt-ott,et al.  Explanation of charged nanoparticle production from hot surfaces , 2008 .

[5]  Sangjun Moon,et al.  Ultrafast patterning of nanoparticles by electrostatic lithography , 2006 .

[6]  M. Attoui,et al.  Using a glowing wire generator for production of charged, uniformly sized nanoparticles at high concentrations , 2006 .

[7]  H. Fissan,et al.  Nanostructured deposition of nanoparticles from the gas phase , 2002 .

[8]  H. Fissan,et al.  Positioning of nanometer-sized particles on flat surfaces by direct deposition from the gas phase , 2001 .

[9]  J. Cazaux Some considerations on the secondary electron emission, δ, from e− irradiated insulators , 1999 .

[10]  Alain Dubus,et al.  Influence on the secondary electron yield of the space charge induced in an insulating target by an electron beam , 1998 .

[11]  D. Tréheux,et al.  Injection and selfconsistent charge transport in bulk insulators , 2007 .

[12]  A. Schmidt-ott,et al.  Mass and size determination of nanometer particles by means of mobility analysis and focused impaction , 2003 .

[13]  Naoki Toshima,et al.  Bimetallic nanoparticles—novel materials for chemical and physical applications , 1998 .