Design for debug: catching design errors in digital chips

For large, complex ICs, engineers need efficient techniques for debugging first silicon. The system presented here consists of an on-chip debug infrastructure and supporting debugger software,which interacts with the infrastructure to make the chip's features accessible through a serial interface.

[1]  Don Douglas Josephson,et al.  Debug methodology for the McKinley processor , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

[2]  J.L. van Meerbergen,et al.  Heterogeneous multiprocessor for the management of real-time video and graphics streams , 2000, IEEE Journal of Solid-State Circuits.

[3]  Santanu Dutta,et al.  Viper: A Multiprocessor SOC for Advanced Set-Top Box and Digital TV Systems , 2001, IEEE Des. Test Comput..

[4]  Bart Vermeulen,et al.  Test and debug strategy of the PNX8525 Nexperia/sup TM/ digital video platform system chip , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

[5]  Bart Vermeulen,et al.  Silicon debug: scan chains alone are not enough , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[6]  Jos van Beers,et al.  Test features of a core-based co-processor array for video applications , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).

[7]  Derek Feltham,et al.  Pentium(R) Pro processor design for test and debug , 1997, Proceedings International Test Conference 1997.

[8]  Sridhar Narayanan,et al.  Testability, debuggability, and manufacturability features of the UltraSPARC-I microprocessor , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

[9]  Hong Hao,et al.  Clock controller design in SuperSPARC II microprocessor , 1995, Proceedings of ICCD '95 International Conference on Computer Design. VLSI in Computers and Processors.

[10]  Derek Feltham,et al.  Pentium Pro Processor Design for Test and Debug , 1998, IEEE Des. Test Comput..

[11]  Alfred L. Crouch,et al.  Testability features of the MC68060 microprocessor , 1994, Proceedings., International Test Conference.