Power property analysis for CMOS integrated circuits

Power consumption has become one of the primary constraints of integrated circuit designs, especially for wireless communication environments and battery-operated applications. Some important power information is very needed to be known in design phases. In this paper, two parameters of variation and expectation rate (VER) and maximum-skew ratio (MSR) are defined along with expectation and variation to describe the complicated total power behavioral. To achieve accurate analysis of all these power properties, a quantified experimental method is proposed based on the existing dynamic and leakage power models and the results show the analysis environment and the parameters are very useful for low power and high performance circuit system designs

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