Degradation in Common Dynamic Environments

ABSTRACT Degradation studies are often used to assess reliability of products subject to degradation-induced soft failures. Because of limited test resources, several test subjects may have to share a test rig and have their degradation measured by the same operator. The common environments experienced by subjects in the same group introduce significant interindividual correlations in their degradation, which is known as the block effect. In the present article, the Wiener process is used to model product degradation, and the group-specific random environments are captured using a stochastic time scale. Both semiparametric and parametric estimation procedures are developed for the model. Maximum likelihood estimations of the model parameters for both the semiparametric and parametric models are obtained with the help of the EM algorithm. Performance of the maximum likelihood estimators is validated through large sample asymptotics and small sample simulations. The proposed models are illustrated by an application to lumen maintenance data of blue light-emitting diodes. Supplementary materials for this article are available online.

[1]  William Q. Meeker,et al.  A Review of Accelerated Test Models , 2006, 0708.0369.

[2]  Jon A. Wellner,et al.  TWO LIKELIHOOD-BASED SEMIPARAMETRIC ESTIMATION METHODS FOR PANEL COUNT DATA WITH COVARIATES , 2005, math/0509132.

[3]  Alan H. Feiveson,et al.  Reliability of Space-Shuttle Pressure Vessels With Random Batch Effects , 2000, Technometrics.

[4]  Jon A. Wellner,et al.  Two estimators of the mean of a counting process with panel count data , 2000 .

[5]  B. Jørgensen Statistical Properties of the Generalized Inverse Gaussian Distribution , 1981 .

[6]  Donghua Zhou,et al.  A Residual Storage Life Prediction Approach for Systems With Operation State Switches , 2014, IEEE Transactions on Industrial Electronics.

[7]  E. Seneta,et al.  The Variance Gamma (V.G.) Model for Share Market Returns , 1990 .

[8]  Nan Chen,et al.  The Inverse Gaussian Process as a Degradation Model , 2014, Technometrics.

[9]  S. Maxwell,et al.  Multivariate Analysis of Variance , 1985 .

[10]  Zhi-Sheng Ye,et al.  Robust Degradation Analysis With Non-Gaussian Measurement Errors , 2017, IEEE Transactions on Instrumentation and Measurement.

[11]  Donghua Zhou,et al.  Remaining useful life estimation - A review on the statistical data driven approaches , 2011, Eur. J. Oper. Res..

[12]  Ramón V. León,et al.  Bayesian Modeling of Accelerated Life Tests with Random Effects , 2007 .

[13]  G. Geoffrey Vining,et al.  Reliability Data Analysis for Life Test Designed Experiments with Sub-Sampling , 2013, Qual. Reliab. Eng. Int..

[14]  Xiao-Sheng Si,et al.  An Adaptive Prognostic Approach via Nonlinear Degradation Modeling: Application to Battery Data , 2015, IEEE Transactions on Industrial Electronics.

[15]  Zhi-Sheng Ye,et al.  RUL Prediction of Deteriorating Products Using an Adaptive Wiener Process Model , 2017, IEEE Transactions on Industrial Informatics.

[16]  Jerald F. Lawless,et al.  On a scheme for predictive maintenance , 2007, Eur. J. Oper. Res..

[17]  Nagi Gebraeel,et al.  A switching diffusion model for lifetime estimation in randomly varying environments , 2014 .

[18]  G. Geoffrey Vining,et al.  Reliability Data Analysis for Life Test Experiments with Subsampling , 2010 .

[19]  P. Carr,et al.  The Variance Gamma Process and Option Pricing , 1998 .

[20]  J. B. Seery,et al.  Numerical evaluation of the modified Bessel functions I and K , 1981 .

[21]  Loon Ching Tang,et al.  Analysis of Reliability Experiments with Blocking , 2013 .

[22]  W. J. Padgett,et al.  Inference from Accelerated Degradation and Failure Data Based on Gaussian Process Models , 2004, Lifetime data analysis.

[23]  Xingqiu Zhao,et al.  NEW MULTI-SAMPLE NONPARAMETRIC TESTS FOR PANEL COUNT DATA , 2009, 0904.2952.

[24]  Dan Zhang,et al.  A fully integrated double-loop approach to the design of statistically and energy efficient accelerated life tests , 2016 .

[25]  Xiao Wang,et al.  An Inverse Gaussian Process Model for Degradation Data , 2010, Technometrics.

[26]  Xiao Wang,et al.  Semiparametric inference on a class of Wiener processes , 2009 .

[27]  Tomasz Rolski,et al.  Stochastic Processes for Insurance and Finance , 2001 .

[28]  Ramón V. León,et al.  Effect of Not Having Homogeneous Test Units in Accelerated Life Tests , 2009 .

[29]  Xiao Wang,et al.  Wiener processes with random effects for degradation data , 2010, J. Multivar. Anal..

[30]  Xiao Liu,et al.  Condition-based maintenance for continuously monitored degrading systems with multiple failure modes , 2013 .

[31]  Ole E. Barndorff-Nielsen,et al.  Some parametric models on the simplex , 1991 .

[32]  R. Haase,et al.  Multivariate analysis of variance. , 1987 .

[33]  Ole E. Barndorff-Nielsen,et al.  Processes of normal inverse Gaussian type , 1997, Finance Stochastics.

[34]  Haitao Liao,et al.  Reliability inference for field conditions from accelerated degradation testing , 2006 .

[35]  Sergei Levendorskii,et al.  Feller processes of normal inverse Gaussian type , 2001 .

[36]  Min Xie,et al.  Stochastic modelling and analysis of degradation for highly reliable products , 2015 .

[37]  Kwok-Leung Tsui,et al.  Degradation Data Analysis Using Wiener Processes With Measurement Errors , 2013, IEEE Transactions on Reliability.

[38]  David W. Coit,et al.  n Subpopulations experiencing stochastic degradation: reliability modeling, burn-in, and preventive replacement optimization , 2013 .

[39]  Bo Guo,et al.  A maintenance optimization model for mission-oriented systems based on Wiener degradation , 2013, Reliab. Eng. Syst. Saf..

[40]  K. Liang,et al.  Asymptotic Properties of Maximum Likelihood Estimators and Likelihood Ratio Tests under Nonstandard Conditions , 1987 .