论文信息 - Structural analysis of multilayer graphene via atomic moiré interferometry - 字舞流文

Structural analysis of multilayer graphene via atomic moiré interferometry

National Institute of Standards | Technology | P. First | M. Ruan | W. Heer | D. Miller | G. M. Rutter | K. D. Kubista | J. A. S. S. O. Physics | Georgia Institute of Technology Center for Nanoscale Science | D. Miller