Real time phase stepping pattern projection profilometry

A single-shot fringe projection profilometry system based on simultaneous projection of four phase-shifted sinusoidal fringe patterns generated at four different wavelengths is described. The system includes a fringe pattern generation module containing four blocks with four near-infrared diode lasers and a registration module with four CCD cameras. In order to simplify the technical solution and to avoid the stringent requirement for stability in the case of interferometric fringe generation, we study both theoretically and experimentally realization of the proposed system by using of a phase grating as well as a holographic optical element for reconstruction of two point sources. The results of the measurement of the relative and absolute coordinates of test objects for both types of diffraction gratings are presented.

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