Influence of Cu diffusion conditions on the switching of Cu-SiO2-based resistive memory devices

[1]  V. B. Kopylov,et al.  Thermal evolution of the chemical structure and properties of silicon oxides , 2008 .

[2]  Moshe Eizenberg,et al.  Copper ion diffusion in porous and nonporous SiO2-based dielectrics using bias thermal stress and thermal stress tests , 2008 .

[3]  Chen Xi-meng,et al.  Atomic Diffusion in Cu/Si (111) and Cu/SiO2/Si (111) Systems by Neutral Cluster Beam Deposition , 2008 .

[4]  M. Kozicki,et al.  Bipolar and Unipolar Resistive Switching in Cu-Doped $ \hbox{SiO}_{2}$ , 2007, IEEE Transactions on Electron Devices.

[5]  Maria Mitkova,et al.  Structure of copper-doped tungsten oxide films for solid-state memory , 2007 .

[6]  N. Kishimoto,et al.  Effect of indentation and annealing on 2 MeV Cu ion-implanted SiO2 , 2007 .

[7]  Understanding the behaviors of Cu during a post-gate-oxidation device process by using an isotope tracking analysis , 2006 .

[8]  C. Glover,et al.  Diffusion limited Cu and Au nanocrystal formation in thin film SiO2 , 2006 .

[9]  M. Kozicki,et al.  Nanoscale memory elements based on solid-state electrolytes , 2005, IEEE Transactions on Nanotechnology.

[10]  Maria Mitkova,et al.  Information storage using nanoscale electrodeposition of metal in solid electrolytes , 2003 .

[11]  J. Ekerdt,et al.  Surface and structure analysis of ultrathin multilayer structures for copper diffusion studies , 2001 .

[12]  W. S. Li,et al.  Raman spectra of CuO nanocrystals , 1999 .

[13]  C. K. Yang,et al.  Atomic force microscopy and Raman spectroscopy studies on the oxidation of Cu thin films , 1995 .

[14]  William G. Oldham,et al.  Copper transport in thermal SiO2 , 1993 .

[15]  Lewis,et al.  Silicon dioxide defects induced by metal impurities. , 1990, Physical review. B, Condensed matter.

[16]  Bell,et al.  Raman spectroscopy of SiO2 glass at high pressure. , 1986, Physical review letters.

[17]  Lawrence R. Doolittle,et al.  Algorithms for the rapid simulation of Rutherford backscattering spectra , 1985 .