Assessment of Thermomechanical Damage of Electronic Parts Due to Solder Dipping as a Postmanufacturing Process
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D. Das | D. Pinsky | S. Ganesan | T.Y. Lin | M.G. Pecht | S. Sengupta | W. Rollins
[1] G. Ganesan,et al. Role of materials evolution in VLSI plastic packages in improving reflow soldering performance , 1994, 1994 Proceedings. 44th Electronic Components and Technology Conference.
[2] M. Pecht,et al. In-situ measurements of surface mount IC package deformations during reflow soldering , 1997 .
[3] Michael G. Pecht,et al. The impact of electrical current, mechanical bending, and thermal annealing on tin whisker growth , 2007, Microelectron. Reliab..
[4] Tong Fang,et al. Statistical analysis of tin whisker growth , 2006, Microelectron. Reliab..
[5] T. Steiner,et al. Investigations of Large PLCC Package Cracking During Surface Mount Exposure , 1987 .
[6] M. Osterman,et al. The Effect of Annealing on Tin Whisker Growth , 2006, IEEE Transactions on Electronics Packaging Manufacturing.
[7] Michael Pecht,et al. Lead-free Electronics , 2006 .
[8] Michael Osterman,et al. Tin whisker risk assessment , 2006 .
[10] Mitsuo Fukuda. Reliability of semiconductor lasers used in current communication systems and sensing equipment , 2007, Microelectron. Reliab..
[11] J. P. le Jannou,et al. Representation of thermal behavior of electronic components for the creation of a databank , 1991 .
[12] Patrick McCluskey,et al. Failure Analysis of Assemblies and Devices , 2001 .
[13] P. Alpern,et al. A simple model for the mode II popcorn effect in thin plastic IC packages , 2003, 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..
[14] R. Thomas,et al. Stress-Induced Deformation of Aluminum Metallization in Plastic Molded Semiconductor Devices , 1985 .
[15] Michael Pecht,et al. A model for moisture induced corrosion failures in microelectronic packages , 1990 .
[16] G. Hawkins,et al. Progression of damage caused by temperature cycling on a large die in a molded plastic package , 1990, 40th Conference Proceedings on Electronic Components and Technology.
[17] D. Suhl. Thermally induced IC package cracking , 1990, InterSociety Conference on Thermal Phenomena in Electronic Systems.
[18] Tingyu Lin,et al. Moisture diffusion and heat transfer in plastic IC packages , 1996 .
[19] M. Osterman,et al. Tin whiskering risk factors , 2004, IEEE Transactions on Components and Packaging Technologies.
[20] S. Rajagopal,et al. The impact of lead-free legislation exemptions on the electronics industry , 2004, IEEE Transactions on Electronics Packaging Manufacturing.