Digital metrology of polycrystalline networks of methyl acrylate layers
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Y. Ushenko | M. Gorsky | P. Panas | O. Dubolazov | P. Ryabiy | Y. Galushko | M. Gavrylyak | Daniyar Jarykbassov | Wenjun Yan | Olexander Arkhelyuk | V. Dumenko
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Y. Ushenko | M. Gorsky | P. Panas | O. Dubolazov | P. Ryabiy | Y. Galushko | M. Gavrylyak | Daniyar Jarykbassov | Wenjun Yan | Olexander Arkhelyuk | V. Dumenko