SiC MOSFET Reliability Update
暂无分享,去创建一个
Jim Richmond | Zoltan Ring | Mrinal K. Das | Anthony Olmedo | J. Richmond | M. Das | Q. Zhang | S. Haney | Sarah K. Haney | Q. Jon Zhang | Z. Ring | Anthony Olmedo
[1] J. Cooper,et al. Time-dependent-dielectric-breakdown measurements of thermal oxides on n-type 6H-SiC , 1999 .
[2] H. B. Harrison,et al. Improved reliability of NO-nitrided SiO2 grown on p-type 4H-SiC , 1998, IEEE Electron Device Letters.
[3] B. Yeats,et al. Assessing the reliability of silicon nitride capacitors in a GaAs IC process , 1998 .