Long-path second-harmonic interferometer with nanosecond time resolution: reliable diagnostic tool for electron density measurement in pulsed plasma devices.
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L. Bonelli | F. Giammanco | W. Waggoner | T. Del Rosso | M. Binderbauer | E. Paganini | I. Isakov | F. Conti | M. Anderson | A. Balvis | V. Matvienko | G. Strashnoy
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