Recognizing black point in wheat kernels and determining its extent using multidimensional feature extraction and a naive Bayes classifier
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Jun Hu | Dong Liang | Liang Han | Jibo Yue | Hao Yang | Linsheng Huang | Chengquan Zhou | Guijun Yang | Ruirui Yan | Lijun Xu | Guijun Yang | Dong Liang | Linsheng Huang | Jibo Yue | Hao Yang | Chengquan Zhou | R. Yan | Liang Han | Jun Hu | Lijun Xu
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