Algorithms for current monitor based diagnosis of bridging and leakage faults

Current monitor based diagnosis algorithms for bridging and leakage faults for combinational and sequential circuits are described. Experimental evaluation results of these algorithms are represented. The algorithms do not use fault dictionaries. A set of ordered-pairs of sets (SOPS) is used to represent all two line bridging faults. If m is the size of the circuit then SOPS uses O(m) space to represent these faults. The resulting algorithm takes time O(mN), where N is the size of the test set.<<ETX>>

[1]  Miron Abramovici A Hierarchical, Path-Oriented Approach to Fault Diagnosis in Modular Combinational Circuits , 1982, IEEE Transactions on Computers.

[2]  Wojciech Maly,et al.  Current sensing for built-in testing of CMOS circuits , 1988, Proceedings 1988 IEEE International Conference on Computer Design: VLSI.

[3]  Melvin A. Breuer,et al.  Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis , 1980, IEEE Transactions on Computers.

[4]  Sreejit Chakravarty,et al.  On Computing Tests for Bridging and Leakage Faults: Complexity Results and Universal Test Sets , 1992, The Fifth International Conference on VLSI Design.

[5]  J. A. Waicukauski Diagnosis of BIST Failures by PPSFP simulation , 1987 .

[6]  Janusz Rajski,et al.  A method of fault analysis for test generation and fault diagnosis , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[7]  J.A. Waicukauski,et al.  Failure diagnosis of structured VLSI , 1989, IEEE Design & Test of Computers.

[8]  Wojciech Maly,et al.  Test generation for current testing , 1989, [1989] Proceedings of the 1st European Test Conference.

[9]  Wojciech Maly,et al.  Built-in current testing-feasibility study , 1988, [1988] IEEE International Conference on Computer-Aided Design (ICCAD-89) Digest of Technical Papers.

[10]  Kenneth R. Bowden,et al.  The Modern Fault Dictionary , 1985, ITC.

[11]  Stephen Y. H. Su,et al.  Fault Diagnosis of MOS Combinational Networks , 1982, IEEE Transactions on Computers.

[12]  Wojciech Maly,et al.  Test generation for current testing (CMOS ICs) , 1990, IEEE Design & Test of Computers.

[13]  John Paul Shen,et al.  A CMOS fault extractor for inductive fault analysis , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[14]  Jerry Soden,et al.  Test Considerations for Gate Oxide Shorts in CMOS ICs , 1986, IEEE Design & Test of Computers.

[15]  Robert C. Aitken,et al.  Fault Location with Current Monitoring , 1991, 1991, Proceedings. International Test Conference.